This solid and hardened Cu-alloy tomographic pin is carefully machined to a 1x10mm round, and sharpened to a point. The pins are used to mount samples at a controlled orientation during FIB for either APT or TEM use.

This makes the pin an ideal holder for samples that must be kept in a rigid orientation, and allows for 360 degree on-axis viewing of the mounted sample without shadowing concerns, but also can be mounted in an APT puck.

This is ideal for both SEM and TEM tomographic applications, and can be directly inserted into either a crimp tube, or in an atom probe sample holder. The grip groove (shown) makes it easy to apply a sliding force to the pin, to assist in sample insertion and removal, minimising the risk of slippage damage to the sample. Pins can nominally be re-used (if handled correctly), by re-sharpening/electropolishing.

Pins are sold in lots of 10pcs. Contact us for custom material specifications.