These holders are designed to allow TEM grids to be used in both TEM and Atom probe and SEM/FIB. The holders take a standard 3.05 mm TEM half-grid, allowing for up to 4 samples to be analysed together at any time. TEM grids are an alternative to Si based micro-needle arrays, and can provide safe transport.

The holders have only one correct orientation when mounting into TEM, APT and FIB, meaning that no rotation or reversal can occur due to sample handling in experiments. The use of these holders is described by Herbig et al, Ultramicroscopy, 2015 32-39 (Paper).

The holders are manufactured from a Cu-alloy, and are suitable for both APT and TEM vacuum conditions. Holders are suitable for use in major APT manufacturer's devices, however the user must determine suitability for any given TEM. End users report successful use with JEOL microscopes. For use in APT, a modification sample "puck" is required (a lateral cut for the holder wings and screw head is needed) - contact us for modification options or instructions.

With care samples can be removed from holders, for example to place into double-tilt or low-background TEM holder systems. This is most straight-forwards using vacuum tweezer devices, but can also be done using normal tweezers. Loading jigs for inserting TEM grids into the holder are available, contact us for more information.

For best results, we recommend the use of rigid half-grids, such as Mo grids.